Work

DMD-based bloom control for intensified imaging systems

Year: 1999

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.349332

Authors: James Castracane, Mikhail A. Gutin

Institutions: University at Albany, State University of New York, InterScience (United States)

Language: English

Topic: CCD and CMOS Imaging Sensors

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2081251076

FWCI: 0.967

Cites:

Cited by: 18

Related to: 10