Light-induced bias stress reversal in polyfluorene thin-film transistors
Year: 2003
Type: article
Source: Journal of Applied Physics
DOI: 10.1063/1.1581352
Authors: A. Salleo, R. A. Street
Institution: Palo Alto Research Center
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2082137946