Work

The EPIC-MOS particle-induced background spectra

Year: 2007
Type: article
Abstract: Context.To analyze diffuse emission that fills the field of view, one must accurately characterize the instrumental backgrounds. For the XMM-Newton EPIC-MOS instrument these backgrounds include a temporally variable “quiescent” component, as well as the strongly variable soft proton contamination.
Language: English
Subfield: Instrumentation
Open Access status: bronze
OpenAlex ID: W2082316064
FWCI: 12.82
Cites: 12
Cited by: 254
Related to: 10