Work

Non-Contact Measurement of Dielectric Constant for a Nanometer-Thick Polymer Film

Year: 2004

Type: article

Source: Key engineering materials

DOI: 10.4028/www.scientific.net/kem.270-273.1143

Authors: Gun Wook Park, Young June Hur, Jae Ho Kim, Sung Hoon Kim, Sam Rok Keum, Kwang Nak Koh

Institutions: Kyungpook National University, Ajou University, Seoul National University

Language: English

Topic: Microwave and Dielectric Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: hybrid

OpenAlex ID: W2082953028

FWCI:

Cites: 20

Cited by:

Related to: 10