Characterization of SiO2-Overcoated Silver-Island Films as Substrates for Surface-Enhanced Raman Scattering
Year: 1996
Type: article
Abstract: Vapor deposition of a 45-Å layer of silver and a subsequent 50−65-Å layer of SiO 2 onto a glass slide is shown to be a viable substrate for surface-enhanced Raman spectroscopy (SERS) and a model of the silica surface suitable for adsorption kinetic studies. The chemistry of the silica is characterized by UV absorption and contact angle measurements. The physical structure is probed by atomic force microscopy to compare the surface roughness of the silver-island film and its SiO 2 overcoat. Auger electron spectroscopy and X-ray photoelectron spectroscopy are used to probe the silica layer for exposure of silver through gaps in the overcoat. Comparison of SERS of dibenzyl disulfide bound to a silver-island film versus that of a silver film protected by the SiO 2 overlayer tests the continuity of the SiO 2 film and its ability to block access of adsorbates to the underlying silver surface. The model silica surface is used to detect the Raman spectrum of adsorbed pyridine and its adsorption isotherm; the adsorbate vibrational frequencies are consistent with previous reports of pyridine on silica.
Source: Analytical Chemistry
DOI: 10.1021/ac950860b
Authors: William B. Lacy, John M. Williams, Lisa A. Wenzler, Thomas P. Beebe, Joel M. Harris
Institution: University of Utah
Language: English
Field: Materials Science
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W2083249873
