Work

Monte Carlo study of electron transport in silicon inversion layers

Year: 1993

Type: article

Source: Physical review. B, Condensed matter

DOI: 10.1103/physrevb.48.2244

Authors: M. V. Fischetti, S. E. Laux

Institutions: Cambridge Scientific (United States), IBM Research - Thomas J. Watson Research Center

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2083803899

FWCI: 11.05

Cites: 129

Cited by: 516

Related to: 10