Work

Silicon single crystal as back-reflector for high-intensity hard x-rays

Year: 2014

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.2061087

Authors: Tom Pardini, Sébastien Boutet, Joseph Bradley, Tilo Doeppner, Luke B. Fletcher, Dennis F. Gardner, Randy M. Hill, Mark S. Hunter, Jacek Krzywinski, Marc Messerschmidt, Arthur E. Pak, Florian Quirin, Klaus Sokolowski-Tinten, Garth J. Williams, Stefan P. Hau-Riege

Institutions: Lawrence Livermore National Laboratory, SLAC National Accelerator Laboratory, Joint Institute for Laboratory Astrophysics, University of Duisburg-Essen

Language: English

Topic: Advanced X-ray Imaging Techniques

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funder: SLAC National Accelerator Laboratory

OpenAlex ID: W2084008779

FWCI: 0.95

Cites: 13

Cited by: 1

Related to: 10