Analytical solutions to estimate the stress induced polarization shift and the temperature sensitivity of optical waveguides
Year: 2004
Type: article
Source: Journal of Applied Physics
DOI: 10.1063/1.1646432
Institution: Princeton University
Language: English
Topic: Photonic and Optical Devices
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2084427083