Work

Direct measurements of transient structures by means of time-resolved x-ray diffraction

Year: 1998

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.306132

Authors: Peilin Chen, Ivan V. Tomov, Peter M. Rentzepis

Institution: University of California, Irvine

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funders: W. M. Keck Foundation, Division of Chemistry

OpenAlex ID: W2084652684

FWCI:

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