Work

Electron Beam Study of Silicide Schottky Diodes

Year: 1981

Type: article

Source: MRS Proceedings

DOI: 10.1557/proc-10-319

Authors: H.-C. W. Huang, C. F. Aliotta, P. S. Ho

Institutions: IBM (United States), IBM Research - Thomas J. Watson Research Center

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2085119622

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Cites: 14

Cited by:

Related to: 10