Work

Univariate and Bivariate Loglinear Models for Discrete Test Score Distributions

Year: 2000

Type: article

Source: Journal of Educational and Behavioral Statistics

DOI: 10.3102/10769986025002133

Authors: Paul W. Holland, Dorothy T. Thayer

Institutions: University of California, Berkeley, Educational Testing Service

Language: English

Topic: Psychometric Methodologies and Testing

Subfield: Management Science and Operations Research

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2085953789

FWCI: 4.234

Cites: 52

Cited by: 155

Related to: 10