Work

An Experimental Investigation of the Tradeoff between Switching Losses and EMI Generation With Hard-Switched All-Si, Si-SiC, and All-SiC Device Combinations

Year: 2013

Type: article

Source: IEEE Transactions on Power Electronics

DOI: 10.1109/tpel.2013.2278919

Authors: Niall Oswald, Philip Anthony, Neville McNeill, Bernard H. Stark

Institution: University of Bristol

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: Engineering and Physical Sciences Research Council

Awards: Underpinning Power Electronics 2012: Components Theme, Pulse quietening at source for higher-frequency power and signal switching

OpenAlex ID: W2086397266

FWCI: 10.6

Cites: 52

Cited by: 517

Related to: 10