Work

Advanced electronic phase stepped interferometry (EPSI) for detection and characterization of early-stage damage in aerospace materials

Year: 1999

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.339841

Authors: James L. Blackshire, Russell C. Hardie, M. I. Younus

Institution: University of Dayton

Language: English

Topic: Optical measurement and interference techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2087026314

FWCI:

Cites: 6

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Related to: 10