Atomic force microscopy study of the growth mechanisms of nanostructured sputtered Au film on Si(111): Evolution with film thickness and annealing time
Year: 2010
Type: article
Source: Journal of Applied Physics
DOI: 10.1063/1.3428467
Authors: F. Ruffino, M. G. Grimaldi
Language: English
Subfield: Computational Mechanics
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2087530423