Work

Feedback-controlled random test generation

Year: 2015

Type: conference-paper

Source: International Symposium on Software Testing and Analysis

DOI: 10.1145/2771783.2771805

Authors: Kohsuke Yatoh, Kazunori Sakamoto, Fuyuki Ishikawa, Shinichi Honiden

Institutions: The University of Tokyo, National Institute of Informatics

Language: English

Topic: Software Testing and Debugging Techniques

Subfield: Software

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2087758025

FWCI: 0.833

Cites: 28

Cited by: 14

Related to: 10