Work

A Self-Consistent Method for Estimating Non-Step Junction Doping Profiles from Capacitance-Voltage Measurements

Year: 1971

Type: article

Source: Journal of The Electrochemical Society

DOI: 10.1149/1.2408234

Author: R. B. Fair

Language: English

Topic: Semiconductor materials and interfaces

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2087926238

FWCI: 0.666

Cites:

Cited by: 5

Related to: 10