Year: 2012
Type: conference-paper
Abstract: We evaluate the low dose rate sensitivity in several families of discrete bipolar transistors across device parameter, quality assurance level, and irradiation bias configuration. The 2N2222 showed the most significant low dose rate sensitivity, with low dose rate enhancement factor of ×3.91 after 100 krad(Si). The 2N2907 also showed critical degradation levels. The devices irradiated at 10 mrad(Si)/s exceeded specifications after 40 and 50 krad(Si) for the 2N2222 and 2N2907 devices, respectively.
Authors: Dakai Chen, Alyson Topper, James Forney, Brian Triggs, Tony Kazmakites, Ronald Pease, Raymond Ladbury, Kenneth LaBel
Institution: Goddard Space Flight Center
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W2088437936