On the unification of line processes, outlier rejection, and robust statistics with applications in early vision
Year: 1996
Type: article
DOI: 10.1007/bf00131148
Authors: Michael J. Black, Anand Rangarajan
Institutions: Palo Alto Research Center, Yale University
Language: English
Topic: Advanced Vision and Imaging
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2088616581