OpenAlex | Approximate Tolerance Limits and Confidence Limits on Reliability for the Gamma Distribution

Approximate Tolerance Limits and Confidence Limits on Reliability for the Gamma Distribution

Work

Year: 1984

Type: article

Source: IEEE Transactions on Reliability

Authors Lee J. Bain, Max Engelhardt, Wei-Kei Shiue

Institutions Missouri University of Science and Technology, University of Nebraska at Omaha

Cites: 11

Cited by: 18

Related to: 10

FWCI:

Citation percentile (by year/subfield): 72.65

Topic: Statistical Distribution Estimation and Applications

Subfield: Statistics and Probability

Field: Mathematics

Domain: Physical Sciences

Open Access status: closed