Work

The scattering of electrons by surface oxide charges and by lattice vibrations at the silicon-silicon dioxide interface

Year: 1972

Type: article

Source: Surface Science

DOI: 10.1016/0039-6028(72)90183-5

Authors: C.T. Sah, T.H. Ning, L.L. Tschopp

Institutions: University of Illinois Urbana-Champaign, University of Illinois System

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2089382618

FWCI: 14.36

Cites: 26

Cited by: 273

Related to: 10