Resolving Band-Structure Evolution and Defect-Induced States of Single Conjugated Oligomers by Scanning Tunneling Microscopy and Tight-Binding Calculations
Year: 2011
Type: article
Source: Physical Review Letters
Authors: Shiyong Wang, Weihua Wang, Nian Lin
Institution: Hong Kong University of Science and Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2089613105