Work

A review of atomic force microscopy imaging systems: application to molecular metrology and biological sciences

Year: 2004

Type: article

Source: Mechatronics

DOI: 10.1016/j.mechatronics.2004.04.005

Authors: Nader Jalili, Karthik Laxminarayana

Institution: Clemson University

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2089751703

FWCI: 7.019

Cites: 124

Cited by: 644

Related to: 10