Work

SPC chart selection process

Year: 1995

Type: article

Source: Microelectronics Reliability

DOI: 10.1016/0026-2714(95)00119-m

Author: Ronald P. Anjard

Language: English

Topic: Advanced Statistical Process Monitoring

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2089948730

FWCI: 0.294

Cites:

Cited by: 20

Related to: 10