The search for quality: The case of planned obsolescence
Year: 1986
Type: article
Source: Microelectronics Reliability
Authors: Yosef S. Sherif, Ellen L. Rice
Institutions: California Institute of Technology, Jet Propulsion Laboratory
Language: English
Subfield: Management of Technology and Innovation
Domain: Social Sciences
Open Access status: closed
OpenAlex ID: W2090683418