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A Novel Circuit for Transition-Edge Detection: Using a Stochastic Comparator Group to Test Transition-Edge

Year: 2014

Type: conference-paper

Source: Proceedings - Asian Test Symposium/Proceedings

DOI: 10.1109/ats.2014.40

Authors: Takahiro J. Yamaguchi, James S. Tandon, Satoshi Komatsu, Kunihiro Asada

Institutions: Advantest (Japan), The University of Tokyo, Microsemi (United States), Tokyo Denki University

Language: English

Topic: Superconducting and THz Device Technology

Subfield: Astronomy and Astrophysics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funders: Cadence Design Systems, University of Tokyo

OpenAlex ID: W2091119006

FWCI:

Cites: 10

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Related to: 10