Using a straightness reference in obtaining more accurate surface profiles from a long trace profiler
Work
Year: 1992
Type: article
Abstract: The long trace profiler (Takacs et al.) has found significant applications in measuring the surfaces of synchrotron optics. However, requirements of small slope errors at all spatial wavelengths of th... more
Source: Review of Scientific Instruments
Institutions Lawrence Berkeley National Laboratory, Fusion Academy, University of California, Berkeley, Optical Sciences (United States), Brookhaven National Laboratory
Cites: 4
Cited by: 47
Related to: 10
FWCI: 2.358
Citation percentile (by year/subfield): 93.39
Subfield: Computational Mechanics
Field: Engineering
Domain: Physical Sciences
Sustainable Development Goal Sustainable cities and communities
Open Access status: green