Work

The Electrical Measurement of Molecular Junctions

Year: 1998

Type: article

Source: Annals of the New York Academy of Sciences

DOI: 10.1111/j.1749-6632.1998.tb09868.x

Authors: M. A. REED, C. ZHOU, M. R. DESHPANDE, C. J. MULLER, T. P. BURGIN, L. JONES, J. M. TOUR

Institutions: Yale University, University of South Carolina

Language: English

Topic: Molecular Junctions and Nanostructures

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Defense Advanced Research Projects Agency

OpenAlex ID: W2091402886

FWCI: 3.402

Cites: 28

Cited by: 55

Related to: 10