Work

Analysis of serious bit-line failure on 0.19-um 64M DRAM with STI technology

Year: 2000

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.404865

Authors: Chung Lee, Chih-Tung Tang

Institutions: Taiwan Semiconductor Manufacturing Company (Taiwan), Winbond (Taiwan)

Language: English

Topic: Integrated Circuits and Semiconductor Failure Analysis

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2091419117

FWCI:

Cites:

Cited by: 1

Related to: 10