Recent Trends in Surface Characterization and Chemistry with High‐Resolution Scanning Force Methods
Year: 2010
Type: review
Source: Advanced Materials
Institutions: Centre National de la Recherche Scientifique, Aix-Marseille Université, London Centre for Nanotechnology, Centre Interdisciplinaire de Nanoscience de Marseille, Tampere University of Technology, University College London, Aalto University, Tohoku University, Advanced Institute for Materials Research, Tohoku University
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2091578772