Work

Cost of ownership model for inspection of multiple quality attributes

Year: 2003

Type: article

Source: IEEE Transactions on Semiconductor Manufacturing

DOI: 10.1109/tsm.2003.815897

Authors: So Young Sohn, Hyoung Uk Moon

Institution: Yonsei University

Language: English

Topic: Life Cycle Costing Analysis

Subfield: Accounting

Field: Business, Management and Accounting

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2092489775

FWCI: 1.232

Cites: 7

Cited by: 17

Related to: 10