Work

A soft threshold lucky electron model for efficient and accurate numerical device simulation

Year: 1996

Type: article

Source: Solid-State Electronics

DOI: 10.1016/0038-1101(95)00403-3

Authors: Chr. Jungemann, R. Thoma, W.L. Engl

Institution: RWTH Aachen University

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2093507552

FWCI: 1.466

Cites: 19

Cited by: 15

Related to: 10