Work

Stress generation by electromigration

Year: 1976

Type: article

Source: Applied Physics Letters

DOI: 10.1063/1.89024

Authors: I. A. Blech, Conyers Herring

Language: English

Topic: Copper Interconnects and Reliability

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2095470180

FWCI: 1.05

Cites: 10

Cited by: 519

Related to: 10