Year: 2008
Type: conference-paper
Abstract: An approach for measuring linear X-ray polarization over a broad-band using conventional spectroscopic optics is described. A set of multilayer-coated flats reflect the dispersed X-rays to the instrument detectors. The intensity variation as a function of energy and position angle is measured to determine three Stokes parameters: I, Q, and U. By laterally grading the multilayer optics and matching the dispersion of the gratings, one may take advantage of high multilayer reflectivities and achieve modulation factors over 80% over the entire 0.2 to 0.8 keV band. A sample design is shown that could be used with a small orbiting mission.
DOI: 10.1117/12.787249
Author: Herman L. Marshall
Institution: Massachusetts Institute of Technology
Language: English
Subfield: Biomedical Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: bronze
OpenAlex ID: W2096570864