Work

A review of recent MOSFET threshold voltage extraction methods

Year: 2002

Type: article

Source: Microelectronics Reliability

DOI: 10.1016/s0026-2714(02)00027-6

Authors: A. Ortiz-Conde, F.J. Garcı́a Sánchez, J.J. Liou, A. Cerdeira, M. Estrada, Y. Yue

Institutions: Universidad Simón Bolívar, University of Central Florida, Centro de Investigación y de Estudios Avanzados del Instituto Politécnico Nacional, Intersil (United States)

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W2096652287

FWCI: 3.377

Cites: 57

Cited by: 1,050

Related to: 10