Global Sensitivity Analysis for Repeated Measures Studies With Informative Dropout: A Fully Parametric Approach
Year: 2014
Type: article
Authors: Daniel Scharfstein, Aidan McDermott, William Olson, Frank Wiegand
Institution: Johns Hopkins University
Language: English
Subfield: Statistics and Probability
Field: Mathematics
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2097270863
