Work

Integrated optical nanoprobe sensor implemented using a mixed technology CMOS fabrication process

Year: 2005

Type: conference-paper

Source: IEEE International Midwest Symposium on Circuits and Systems (MWSCAS)

DOI: 10.1109/mwscas.2005.1594216

Authors: Kuntao Ye, F.R. Beyette

Institution: University of Cincinnati

Language: English

Topic: CCD and CMOS Imaging Sensors

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2098139693

FWCI: 0.55

Cites: 7

Cited by: 1

Related to: 10