Work

On Soft Error Immunity of Sequential Circuits

Year: 2010

Type: conference-paper

Source: Proceedings - Asian Test Symposium/Proceedings

DOI: 10.1109/ats.2010.27

Authors: Dan Zhu, Tun Li, Si-kun Li

Institution: National University of Defense Technology

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2098149020

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Cites: 14

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Related to: 10