Work

Experimental study of the boron redistribution in bilayer films silicon-based by SIMS technique

Year: 2011

Type: conference-paper

Source: International Conference on Electrical and Electronics Engineering

Authors: Lynda Saci, R. Mahamdi, F. Mansour, Pierre Temple‐Boyer

Institutions: University Frères Mentouri Constantine 1, University of Batna 1, Centre National de la Recherche Scientifique, Laboratoire d'Analyse et d'Architecture des Systèmes

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2098687403

FWCI:

Cites: 12

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Related to: 10