Work

Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain

Year: 2014

Type: article

Source: Proceedings of the IEEE

DOI: 10.1109/jproc.2014.2332291

Authors: Ujjwal Guin, Ke Huang, Daniel DiMase, John M. Carulli, Mohammad Tehranipoor, Yiorgos Makris

Institutions: University of Connecticut, San Diego State University, Texas Instruments (United States), The University of Texas at Dallas

Language: English

Topic: Physical Unclonable Functions (PUFs) and Hardware Security

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2099101940

FWCI: 31.84

Cites: 84

Cited by: 580

Related to: 10