Work

Digital Device Error Rate Trends in Advanced CMOS Technologies

Year: 2006

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/tns.2006.886212

Authors: Matthew J. Gadlage, Paul H. Eaton, Joseph M. Benedetto, Marty Carts, Vivian Zhu, Thomas L. Turflinger

Institutions: Naval Sea Systems Command, Microelectronics Research Development (United States), Alliant Techsystems (United States), Goddard Space Flight Center, Texas Instruments (United States)

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Aeronautics and Space Administration

OpenAlex ID: W2100138735

FWCI: 3.281

Cites: 12

Cited by: 32

Related to: 10