Work

SVD-Based Quality Metric for Image and Video Using Machine Learning

Year: 2011

Type: article

Source: IEEE Transactions on Systems Man and Cybernetics Part B (Cybernetics)

DOI: 10.1109/tsmcb.2011.2163391

Authors: M. Narwaria, Weisi Lin

Institution: Nanyang Technological University

Language: English

Topic: Image and Video Quality Assessment

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2102817897

FWCI: 10.32

Cites: 73

Cited by: 152

Related to: 10