Work

Interfacial toughness measurements for thin films on substrates

Year: 2002

Type: article

Source: Acta Materialia

DOI: 10.1016/s1359-6454(01)00354-8

Authors: A.A Volinsky, N.R Moody, W.W Gerberich

Institutions: Motorola (United States), Sandia National Laboratories California, University of Minnesota

Language: English

Topic: Metal and Thin Film Mechanics

Subfield: Mechanics of Materials

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2104036104

FWCI: 44.12

Cites: 98

Cited by: 663

Related to: 10