Work

Robust RVM regression using sparse outlier model

Year: 2010

Type: conference-paper

Source: IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings

DOI: 10.1109/cvpr.2010.5539861

Authors: Kaushik Mitra, Ashok Veeraraghavan, Rama Chellappa

Institutions: University of Maryland, College Park, Mitsubishi Electric Research Laboratories (United States)

Language: English

Topic: Gaussian Processes and Bayesian Inference

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2104037165

FWCI: 1.81

Cites: 24

Cited by: 28

Related to: 10