Work

Local scale control for edge detection and blur estimation

Year: 1998

Type: article

Source: IEEE Transactions on Pattern Analysis and Machine Intelligence

DOI: 10.1109/34.689301

Authors: J.H. Elder, S.W. Zucker

Institutions: York University, Yale University

Language: English

Topic: Image and Object Detection Techniques

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: U.S. Air Force, Natural Sciences and Engineering Research Council of Canada, Air Force Office of Scientific Research

OpenAlex ID: W2104564430

FWCI: 6.522

Cites: 48

Cited by: 562

Related to: 10