Work

Comparison of silicon density standards at NRLM and IMGC

Year: 1993

Type: article

Source: IEEE Transactions on Instrumentation and Measurement

DOI: 10.1109/19.278557

Authors: A.M. Peuto, A. Sacconi, M. Mosca, K.-I. Fujii, M. Tanaka, Y. Nezu

Language: English

Topic: Scientific Measurement and Uncertainty Evaluation

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2105586849

FWCI: 3.98

Cites: 8

Cited by: 16

Related to: 10