Work

Problems Associated with Quality control Sampling in Modern IC Manufacturing

Year: 1987

Type: article

Source: IEEE Transactions on Components Hybrids and Manufacturing Technology

DOI: 10.1109/tchmt.1987.1134700

Author: L. Pesotchinsky

Institution: San Jose State University

Language: English

Topic: Advanced Statistical Process Monitoring

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2105968515

FWCI:

Cites: 12

Cited by: 8

Related to: 10