An efficient method for compressing test data
Year: 2002
Type: conference-paper
Authors: T. Yamaguchi, M. Tilgner, M. Ishida, Dong Sam Ha
Institutions: Advantest (Japan), Tokyo Institute of Technology, Virginia Tech
Language: English
Subfield: Theoretical Computer Science
Field: Mathematics
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2106182768