Moduli determination in polyimide film bilayer systems: Prospects for depth profiling using impulsive stimulated thermal scattering
Year: 1995
Type: article
Source: Journal of Applied Physics
DOI: 10.1063/1.359471
Institution: Massachusetts Institute of Technology
Language: English
Subfield: Mechanics of Materials
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2106606349
