Work

Characterization of the structural defects in CVD-grown monolayered MoS 2 using near-field photoluminescence imaging

Year: 2015

Type: article

Source: Nanoscale

DOI: 10.1039/c5nr02897c

Authors: Yongjun Lee, Seki Park, Hyun Kim, Gang Hee Han, Young Hee Lee, Jeongyong Kim

Institutions: Institute for Basic Science, Sungkyunkwan University

Language: English

Topic: 2D Materials and Applications

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2106940183

FWCI: 5.86

Cites: 29

Cited by: 108

Related to: 10