Wafer level testing for semiconductor laser manufacture via spatially resolved photoluminescence
Year: 1995
Type: article
DOI: 10.1109/2944.488395
Authors: G.E. Carver, R.W. Heebner, G. Astfalk
Institutions: AT&T (United States), Hewlett-Packard (United States)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2106954742